MOQ: | 1 |
가격: | Customized |
표준 포장: | Carton Box |
배송 기간: | 3 Days |
결제 방법: | T/T |
공급 능력: | 100 sets per month |
Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X
Product information:
This test probe complies with the requirements of Probe B as specified in IEC 61032 and IEC 60529 IP2X. It features an M6 threaded hole at the end of the handle, allowing it to be connected to a force gauge for precise testing applications.
Technical parameters:
Parameters /Model | SN2210-2T |
Name | Standard test probe with force |
Joint 1 | 30±0.2 (mm) |
Joint 2 | 60±0.2 (mm) |
Finger length | 80±0.2 (mm) |
Fingertip to baffle | 180±0.2 (mm) |
Cylindrical | R2±0.05 (mm) |
Spherical | S4±0.05 (mm) |
Fingertip cutting bevel angle | 37o 0 -10’ |
Fingertip taper | 14 o 0 -10’ |
Test finger diameter | Ф12 0 -0.05 (mm) |
A-A Section diameter | Ф50(mm) |
A-A Section width | 20±0.2 |
Baffle diameter | Ф75±0.2(mm) |
Baffle thickness | 5±0.5(mm) |
Built-in Force | 0-50N force, resolution of 5N |
MOQ: | 1 |
가격: | Customized |
표준 포장: | Carton Box |
배송 기간: | 3 Days |
결제 방법: | T/T |
공급 능력: | 100 sets per month |
Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X
Product information:
This test probe complies with the requirements of Probe B as specified in IEC 61032 and IEC 60529 IP2X. It features an M6 threaded hole at the end of the handle, allowing it to be connected to a force gauge for precise testing applications.
Technical parameters:
Parameters /Model | SN2210-2T |
Name | Standard test probe with force |
Joint 1 | 30±0.2 (mm) |
Joint 2 | 60±0.2 (mm) |
Finger length | 80±0.2 (mm) |
Fingertip to baffle | 180±0.2 (mm) |
Cylindrical | R2±0.05 (mm) |
Spherical | S4±0.05 (mm) |
Fingertip cutting bevel angle | 37o 0 -10’ |
Fingertip taper | 14 o 0 -10’ |
Test finger diameter | Ф12 0 -0.05 (mm) |
A-A Section diameter | Ф50(mm) |
A-A Section width | 20±0.2 |
Baffle diameter | Ф75±0.2(mm) |
Baffle thickness | 5±0.5(mm) |
Built-in Force | 0-50N force, resolution of 5N |